The growth of microcrystalline thin films using ECR-PECVD: Silicon and Silicon-Germanium

dc.contributor.author Huh, Yung
dc.contributor.department Electrical and Computer Engineering
dc.date 2020-08-05T05:02:07.000
dc.date.accessioned 2021-02-26T08:40:12Z
dc.date.available 2021-02-26T08:40:12Z
dc.date.copyright Tue Jan 01 00:00:00 UTC 2002
dc.date.issued 2002-01-01
dc.format.mimetype application/pdf
dc.identifier archive/lib.dr.iastate.edu/rtd/19882/
dc.identifier.articleid 20881
dc.identifier.contextkey 18779845
dc.identifier.doi https://doi.org/10.31274/rtd-20200803-104
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath rtd/19882
dc.identifier.uri https://dr.lib.iastate.edu/handle/20.500.12876/97249
dc.language.iso en
dc.source.bitstream archive/lib.dr.iastate.edu/rtd/19882/Huh_ISU_2002_H84.pdf|||Fri Jan 14 22:00:44 UTC 2022
dc.title The growth of microcrystalline thin films using ECR-PECVD: Silicon and Silicon-Germanium
dc.type article
dc.type.genre thesis
dspace.entity.type Publication
relation.isOrgUnitOfPublication a75a044c-d11e-44cd-af4f-dab1d83339ff
thesis.degree.discipline Electrical Engineering
thesis.degree.level thesis
thesis.degree.name Master of Science
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