Detection of Coating Adhesion Defects Using Fast Infrared Scanning Technique

dc.contributor.author hartikainen, Jari
dc.date 2018-02-14T03:35:53.000
dc.date.accessioned 2020-06-30T06:36:06Z
dc.date.available 2020-06-30T06:36:06Z
dc.date.copyright Mon Jan 01 00:00:00 UTC 1990
dc.date.issued 1990
dc.description.abstract <p>In the past ten years a variety of thermal wave nondestructive measurement systems have been developed but most of them are too slow, fragile or expensive in order to be applied in industry. The standard approach to increase the measurement speed has been to apply a uniform heat pulse and to monitor c he surface temperature with an infrared camera [1]. However, in many practical situations the full speed of an infrared camera is not really needed and thus a moving line source can be used for heating and the surface temperature rise can be detected with a one dimensional infrared scanner without a significant increase in inspection time. This approach has several benefits including:</p>
dc.format.mimetype application/pdf
dc.identifier archive/lib.dr.iastate.edu/qnde/1990/allcontent/128/
dc.identifier.articleid 1602
dc.identifier.contextkey 5777126
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath qnde/1990/allcontent/128
dc.identifier.uri https://dr.lib.iastate.edu/handle/20.500.12876/59506
dc.language.iso en
dc.source.bitstream archive/lib.dr.iastate.edu/qnde/1990/allcontent/128/1990_HartikainenJ_DetectionCoatingAdhesion.pdf|||Fri Jan 14 19:30:02 UTC 2022
dc.source.uri 10.1007/978-1-4684-5772-8_128
dc.subject.disciplines Acoustics, Dynamics, and Controls
dc.subject.disciplines Electromagnetics and Photonics
dc.title Detection of Coating Adhesion Defects Using Fast Infrared Scanning Technique
dc.type event
dc.type.genre article
dspace.entity.type Publication
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