Direct Observations of Field-Intensity-Dependent Dielectric Breakdown Mechanisms in TiO2 Single Nanocrystals Tian, Xinchun Brennecka, Geoff Tan, Xiaoli
dc.contributor.department Materials Science and Engineering 2020-06-17T20:01:08.000 2020-06-30T06:08:43Z 2020-06-30T06:08:43Z Wed Jan 01 00:00:00 UTC 2020 2020-06-16
dc.description.abstract <p>One of the main challenges for next-generation electric power systems and electronics is to avoid premature dielectric breakdown in insulators and capacitors and to ensure reliable operations at higher electric fields and higher efficiencies. However, dielectric breakdown is a complex phenomenon and often involves many different processes simultaneously. Here we show distinctly different defect-related and intrinsic breakdown processes by studying individual, single-crystalline TiO2 nanoparticles using <em>in situ</em> transmission electron microscopy (TEM). As the applied electric field intensity rises, rutile-to-anatase phase transition, local amorphization/melting, and ablation are identified as the corresponding breakdown processes, the field intensity thresholds of which are found to be related to the position of the intensified field and the duration of the applied bias relative to the time of charged defects accumulation. Our observations reveal an intensity-dependent dielectric response of crystalline oxides at breakdown and suggest possible routes to suppress the initiation of premature dielectric breakdown. Hence, they will aid the design and development of next-generation robust and efficient solid dielectrics.</p>
dc.description.comments <p>This document is the unedited Author’s version of a Submitted Work that was subsequently accepted for publication in <em>ACS Nano</em>, copyright © American Chemical Society after peer review. To access the final edited and published work see DOI: <a href="" target="_blank">10.1021/acsnano.0c02346</a>. Posted with permission.</p>
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dc.identifier archive/
dc.identifier.articleid 1380
dc.identifier.contextkey 18142721
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath mse_pubs/377
dc.language.iso en
dc.source.bitstream archive/|||Fri Jan 14 23:51:08 UTC 2022
dc.source.uri 10.1021/acsnano.0c02346
dc.subject.disciplines Nanoscience and Nanotechnology
dc.subject.disciplines Nanotechnology Fabrication
dc.subject.keywords TiO2 nanocrystal
dc.subject.keywords dielectric breakdown
dc.subject.keywords in situ biasing TEM
dc.subject.keywords oxygen vacancy
dc.subject.keywords phase transition
dc.title Direct Observations of Field-Intensity-Dependent Dielectric Breakdown Mechanisms in TiO2 Single Nanocrystals
dc.type article
dc.type.genre article
dspace.entity.type Publication
relation.isAuthorOfPublication 62adb010-61c7-4fc2-a651-d8b152a926a9
relation.isOrgUnitOfPublication bf9f7e3e-25bd-44d3-b49c-ed98372dee5e
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