Acoustic Microscopy for Materials Characterization Atalar, A. Jipson, V. Quate, C. 2018-02-13T17:05:51.000 2020-06-30T01:27:55Z 2020-06-30T01:27:55Z Mon Jan 01 00:00:00 UTC 1979 2013-11-07 1979
dc.description.abstract <p>An acoustic microscope with mechanical scanning and piezoelectric film transducers for the input and output has been developed for the microscopic examination of materials.1 In the reflection mode it is possible to work with an acoustic wavelength of 0.5 micrometers and a resolution that compares to that of the optical microscope. The elastic images of material surfaces as recorded with this instrument display interesting features which provide information which complements the optical microscope. In particular we find that different phases show up with good contrast and in alloy material the texture of the grains can be recorded since the grain orientation influences the acoustic reflectivity.</p>
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dc.identifier archive/
dc.identifier.articleid 1041
dc.identifier.contextkey 4803606
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath cnde_yellowjackets_1978/41
dc.language.iso en
dc.relation.ispartofseries Interdisciplinary Program for Quantitative Flaw Definition Annual Reports
dc.source.bitstream archive/|||Sat Jan 15 00:09:15 UTC 2022
dc.subject.disciplines Materials Science and Engineering
dc.subject.keywords Nondestructive Evaluation
dc.title Acoustic Microscopy for Materials Characterization
dc.type article
dc.type.genre 07_nde_for_advanced_materials
dspace.entity.type Publication
relation.isSeriesOfPublication 43920e40-d127-4f4c-9087-dc709815fe7f
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