Micromagnetic modeling of the effects of stress on magnetic properties

dc.contributor.author Zhu, B.
dc.contributor.author Lo, Chester
dc.contributor.author Lee, S. J.
dc.contributor.author Jiles, David
dc.contributor.department Materials Science and Engineering
dc.date 2018-02-14T10:13:06.000
dc.date.accessioned 2020-06-30T06:06:36Z
dc.date.available 2020-06-30T06:06:36Z
dc.date.copyright Mon Jan 01 00:00:00 UTC 2001
dc.date.embargo 2013-09-19
dc.date.issued 2001-06-01
dc.description.abstract <p>A micromagnetic model has been developed for investigating the effect of stress on the magnetic properties of thin films. This effect has been implemented by including the magnetoelastic energy term into the Landau–Lifshitz–Gilbert equation. Magnetization curves of a nickelfilm were calculated under both tensile and compressive stresses of various magnitudes applied along the field direction. The modeling results show that coercivity increased with increasing compressive stress while remanence decreased with increasing tensile stress. The results are in agreement with the experimental data in the literature and can be interpreted in terms of the effects of the applied stress on the irreversible rotation of magnetic moments during magnetization reversal under an applied field.</p>
dc.description.comments <p>The following article appeared in <em>Journal of Applied Physics</em> 89 (2001): 7009 and may be found at <a href="http://dx.doi.org/10.1063/1.1363604" target="_blank">http://dx.doi.org/10.1063/1.1363604</a>.</p>
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dc.identifier archive/lib.dr.iastate.edu/mse_pubs/107/
dc.identifier.articleid 1107
dc.identifier.contextkey 6004831
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath mse_pubs/107
dc.identifier.uri https://dr.lib.iastate.edu/handle/20.500.12876/55433
dc.language.iso en
dc.source.bitstream archive/lib.dr.iastate.edu/mse_pubs/107/2001_Zhu_MicromagneticModeling.pdf|||Fri Jan 14 18:26:14 UTC 2022
dc.source.uri 10.1063/1.1363604
dc.subject.disciplines Electromagnetics and Photonics
dc.subject.keywords Ames Laboratory
dc.subject.keywords CNDE
dc.subject.keywords Magnetic films
dc.subject.keywords Coercive force
dc.subject.keywords Magnetic moments
dc.subject.keywords Magnetization reversals
dc.subject.keywords Metallic thin films
dc.title Micromagnetic modeling of the effects of stress on magnetic properties
dc.type article
dc.type.genre article
dspace.entity.type Publication
relation.isAuthorOfPublication cb9622ce-98bb-47c3-bc98-8ac772e1c44e
relation.isOrgUnitOfPublication bf9f7e3e-25bd-44d3-b49c-ed98372dee5e
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