Scaling analysis of surface roughness in simple models for Molecular-Beam Epitaxy
Scaling analysis of surface roughness in simple models for Molecular-Beam Epitaxy
dc.contributor.author | Kang, H. | |
dc.contributor.author | Evans, James | |
dc.contributor.author | Evans, James | |
dc.contributor.department | Ames Laboratory | |
dc.contributor.department | Physics and Astronomy | |
dc.contributor.department | Mathematics | |
dc.contributor.department | Chemistry | |
dc.date | 2018-02-18T21:32:22.000 | |
dc.date.accessioned | 2020-06-30T06:19:19Z | |
dc.date.available | 2020-06-30T06:19:19Z | |
dc.date.copyright | Wed Jan 01 00:00:00 UTC 1992 | |
dc.date.issued | 1992 | |
dc.description.abstract | <p>There is currently interest in simple models for molecular-beam epitaxy (MBE) which mimic the effect of thermal mobility by allowing immediate incorporation of deposited atoms at kink sites within a distance l of the deposition site. Scaling of the interface width, W, with mean film height, [h], of the form W approximately [h]beta, is analysed. Studies for a solid-on-solid geometry in d = 1 + 1 dimensions revealed a sudden transition from the T = 0 K (l = 0) behavior of beta = 1/2 to a new universality class for l greater-than-or-equal-to 1 with beta = 3/8. We consider the effect of incorporating realistic adsorption-site geometries and deposition dynamics into these d = 1 + 1 MBE models. We find that beta is always less than 3/8 at T = 0 K (l = 0) due to lateral coupling, and that the effective beta increases smoothly with smaller l at least to 3/8. However, for larger l, the simple scaling of W described above breaks down in the physically relevant range of [h].</p> | |
dc.description.comments | <p>This is a manuscript of an article published as Kang, H. C., and J. W. Evans. "Scaling analysis of surface roughness in simple models for molecular-beam epitaxy." <em>Surface Science</em> 269 (1992): 784-789, doi:<a href="http://dx.doi.org/10.1016/0039-6028(92)91349-G" target="_blank">10.1016/0039-6028(92)91349-G</a>. Posted with permission.</p> | |
dc.format.mimetype | application/pdf | |
dc.identifier | archive/lib.dr.iastate.edu/physastro_pubs/391/ | |
dc.identifier.articleid | 1406 | |
dc.identifier.contextkey | 10626556 | |
dc.identifier.s3bucket | isulib-bepress-aws-west | |
dc.identifier.submissionpath | physastro_pubs/391 | |
dc.identifier.uri | https://dr.lib.iastate.edu/handle/20.500.12876/57156 | |
dc.language.iso | en | |
dc.source.bitstream | archive/lib.dr.iastate.edu/physastro_pubs/391/1992_Evans_ScalingAnalysis.pdf|||Fri Jan 14 23:55:30 UTC 2022 | |
dc.source.uri | 10.1016/0039-6028(92)91349-G | |
dc.subject.disciplines | Condensed Matter Physics | |
dc.subject.disciplines | Physics | |
dc.title | Scaling analysis of surface roughness in simple models for Molecular-Beam Epitaxy | |
dc.type | article | |
dc.type.genre | article | |
dspace.entity.type | Publication | |
relation.isAuthorOfPublication | ccb1c87c-15e0-46f4-bd16-0df802755a5b | |
relation.isOrgUnitOfPublication | 25913818-6714-4be5-89a6-f70c8facdf7e | |
relation.isOrgUnitOfPublication | 4a05cd4d-8749-4cff-96b1-32eca381d930 | |
relation.isOrgUnitOfPublication | 82295b2b-0f85-4929-9659-075c93e82c48 | |
relation.isOrgUnitOfPublication | 42864f6e-7a3d-4be3-8b5a-0ae3c3830a11 |
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