A useful computed tomography (CT) or digital radiography (DR) system must simultaneously resolve both the smallest meaningful features and least relevant differences in density in the objects it is designed to inspect. The advent of structural composites and high-density electronic assemblies requires digital x-ray systems that are tailored to their properties. The critical flaw size in graphite composites is thought to be 25 to 50 μm. Similarly, prototype military electronics are now being assembled on circuit boards with conductive patterns only 100 μm in width.