High Resolution X-Ray Computed Tomography for Composites and Electronics Inspection

dc.contributor.author Cueman, M. Kent
dc.contributor.author Thomas, Lewis
dc.contributor.author Trzaskos, Casmir
dc.contributor.author Greskovich, Charles
dc.date 2018-02-14T04:42:47.000
dc.date.accessioned 2020-06-30T06:35:31Z
dc.date.available 2020-06-30T06:35:31Z
dc.date.copyright Sun Jan 01 00:00:00 UTC 1989
dc.date.issued 1989
dc.description.abstract <p>A useful computed tomography (CT) or digital radiography (DR) system must simultaneously resolve both the smallest meaningful features and least relevant differences in density in the objects it is designed to inspect. The advent of structural composites and high-density electronic assemblies requires digital x-ray systems that are tailored to their properties. The critical flaw size in graphite composites is thought to be 25 to 50 μm. Similarly, prototype military electronics are now being assembled on circuit boards with conductive patterns only 100 μm in width.</p>
dc.format.mimetype application/pdf
dc.identifier archive/lib.dr.iastate.edu/qnde/1989/allcontent/55/
dc.identifier.articleid 1931
dc.identifier.contextkey 5783908
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath qnde/1989/allcontent/55
dc.identifier.uri https://dr.lib.iastate.edu/handle/20.500.12876/59425
dc.language.iso en
dc.source.bitstream archive/lib.dr.iastate.edu/qnde/1989/allcontent/55/1989_Cueman_HighResolution.pdf|||Sat Jan 15 00:54:55 UTC 2022
dc.source.uri 10.1007/978-1-4613-0817-1_55
dc.title High Resolution X-Ray Computed Tomography for Composites and Electronics Inspection
dc.type event
dc.type.genre article
dspace.entity.type Publication
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