Properties of Amorphous Silicon Germanium Films and Devices Prepared Using Chemical Annealing

dc.contributor.advisor Vickram Dalal
dc.contributor.author Li, Zhao
dc.contributor.department Department of Electrical and Computer Engineering
dc.date 2018-08-11T15:52:22.000
dc.date.accessioned 2020-06-30T02:46:56Z
dc.date.available 2020-06-30T02:46:56Z
dc.date.copyright Tue Jan 01 00:00:00 UTC 2013
dc.date.embargo 2015-07-30
dc.date.issued 2013-01-01
dc.description.abstract <p>Amorphous silicon germanium solar cells have been extensively used for many years due to the low cost, easy fabrication, tunable bandgap and special properties. However, it is found that the properties of a-SiGe:H materials is not good as a-Si:H, and this limits the application of a-SiGe:H solar cells and brings the stability concern. Recently, it has been shown that this instability is correlated with the presence of multiple bonded Si-H bonds (i.e., SiH2), and a technique, namely chemical annealing, was suggested to improve the quality and the stability of a-SiGe:H. Although a number of results have been reported to produce good a-SiGe:H films but, no chemical annealed devices with good quality were reported and no systemic study was ever done on it. .</p> <p>In this work, chemical annealed a-SiGe:H films and devices, and non chemical annealed films and devices were produced in very high frequency plasma enhanced CVD, and systematic experiments were carried out to study the role of chemical annealing in enhancing the quality of a-SiGe:H solar cells.</p> <p>It is found that the materials were grown using a layer-by-layer approach, where the growth of a thin film was followed by a chemical anneal in hydrogen or helium plasma. Multiple cycles were used to build up the total film thickness. The purpose of the anneal cycle was to subject the material to controlled ion bombardment so as to reduce void density and thereby lead to better microstructure and fewer clustered Si-H and Ge-H bonds. FTIR measurements showed that the films which were prepared using chemical annealing had fewer SiH2 and GeH2 bonds. Electrical measurements showed that the films subjected to chemical anneal had a higher photo/dark conductivity ratio, a smaller Urbach energy and higher electron mobility-lifetime products. p-i-n and n-i-n devices were prepared on stainless steel substrates. Measurements of quantum efficiency in p-i-n devices showed that the hole mobility-lifetime product was also improved when chemical annealing was used.</p>
dc.format.mimetype application/pdf
dc.identifier archive/lib.dr.iastate.edu/etd/13040/
dc.identifier.articleid 4047
dc.identifier.contextkey 4250678
dc.identifier.doi https://doi.org/10.31274/etd-180810-3463
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath etd/13040
dc.identifier.uri https://dr.lib.iastate.edu/handle/20.500.12876/27229
dc.language.iso en
dc.source.bitstream archive/lib.dr.iastate.edu/etd/13040/Li_iastate_0097E_13353.pdf|||Fri Jan 14 19:42:57 UTC 2022
dc.subject.disciplines Electrical and Electronics
dc.subject.disciplines Engineering
dc.subject.keywords amorphous silicon
dc.subject.keywords amorphous silicon germanium
dc.subject.keywords chemical annealing
dc.subject.keywords ion bondboardment
dc.subject.keywords solar cell
dc.title Properties of Amorphous Silicon Germanium Films and Devices Prepared Using Chemical Annealing
dc.type dissertation
dc.type.genre dissertation
dspace.entity.type Publication
relation.isOrgUnitOfPublication a75a044c-d11e-44cd-af4f-dab1d83339ff
thesis.degree.level dissertation
thesis.degree.name Doctor of Philosophy
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