Several strong polyatomic ion signals common in inductively coupled plasma mass spectrometry (ICP-MS) can be used as internal standards to correct for matrix interferences. Signals for most of the polyatomic ions, including metal oxides, are suppressed by a Cs matrix to the same extent as analyte ion signals at nearby m/z values. Examples include [superscript]14N[subscript]2[superscript]+ and [superscript]24Mg[superscript]+, [superscript]35Cl[superscript]16O[superscript]+ and [superscript]55Mn[superscript]+, [superscript]40Ar[superscript]16O[superscript]+ and [superscript]59Co[superscript]+, [superscript]32S[superscript]16O[superscript]+ and [superscript]45Sc[superscript]+, [superscript]40Ar[subscript]2[superscript]+ and [superscript]75As[superscript]+, and [superscript]89Y[superscript]16O[superscript]+ and [superscript]103Rh[superscript]+. These signals should reduce the number of added elements necessary to correct for matrix interferences;Ions are extracted from the ICP through a conventional sampler and skimmer and then deposited on an array of graphite targets at the exit of a set of electrostatic ion lenses. Scandium ion signal is enhanced by choosing appropriate potentials on the ion lenses. The Sc[superscript]+ ion signal is suppressed by the presence of concomitant Cs ions at high concentrations. Comparisons of grounded ion lenses and two different ion lens potential settings were made. The signal is enhanced more extensively by the ion lenses when there are no concentrated concomitant ions. This study indicates that matrix effects in ICP-MS could possibly be alleviated by choosing ion lens potentials such that the ions enter the ion optics with a relatively broad beam cross section; the beam then focused to a smaller size. A photon stop inside the ion lens stack reduces ion transmission and changes the shape of the beam profile from conical to bimodal;Currently available ICP-MS devices can not provide angular ion intensity and composition information, which are necessary to further understand the ion extraction process, the space charge effects and ion loss mechanisms in the second stage of the ICP-MS. In order to increase the ion transmission efficiency in an ICP-MS device, a new ICP-MS device is designed and constructed which can be used to reveal the spatial distribution of the ion beam leaving the skimmer. The detector chamber moves inside a larger outer chamber such that the inner chamber can pivot away from the central line of the ion beam while detecting ions.