Improve Fourier transform profilometry by locally area modulating squared binary structured pattern
| dc.contributor.author | Lohry, William | |
| dc.contributor.author | Zhang, Song | |
| dc.contributor.department | Department of Mechanical Engineering | |
| dc.date | 2019-07-18T06:22:01.000 | |
| dc.date.accessioned | 2020-06-30T06:02:41Z | |
| dc.date.available | 2020-06-30T06:02:41Z | |
| dc.date.copyright | Sun Jan 01 00:00:00 UTC 2012 | |
| dc.date.embargo | 2014-11-06 | |
| dc.date.issued | 2012-08-01 | |
| dc.description.abstract | <p>Our recent study found that it is very difficult to use the binary defocusing technique to completely suppress the 3rd-order harmonics, and thus it is challenging to achieve high-quality three-dimensional (3-D) measurement with the Fourier transformation method. This paper presents a novel approach to effectively eliminate the 3rd order harmonics by modulating the binary structured patterns in both x and y directions. Both simulation and experimental results will be presented to verify the performance of the proposed technique.</p> | |
| dc.description.comments | <p>This is a conference proceeding from <em>Interferometry XVI: Techniques and Analysis</em> 8493 (2012): 1, <a href="http://dx.doi.org/10.1117/12.927439" target="_blank">doi:10.1117/12.927439</a>. Posted with permission.</p> <p>Copyright 2012 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic electronic or print reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.</p> | |
| dc.identifier | archive/lib.dr.iastate.edu/me_conf/63/ | |
| dc.identifier.articleid | 1068 | |
| dc.identifier.contextkey | 6334852 | |
| dc.identifier.s3bucket | isulib-bepress-aws-west | |
| dc.identifier.submissionpath | me_conf/63 | |
| dc.identifier.uri | https://dr.lib.iastate.edu/handle/20.500.12876/54904 | |
| dc.language.iso | en | |
| dc.source.bitstream | archive/lib.dr.iastate.edu/me_conf/63/2012_Zhang_ImproveFourier.pdf|||Sat Jan 15 01:19:53 UTC 2022 | |
| dc.source.uri | 10.1117/12.927439 | |
| dc.subject.disciplines | Computer-Aided Engineering and Design | |
| dc.subject.disciplines | Graphics and Human Computer Interfaces | |
| dc.subject.keywords | Fringe analysis | |
| dc.subject.keywords | binary defocusing | |
| dc.subject.keywords | 3-D shape measurement | |
| dc.subject.keywords | Fourier transform profilometry | |
| dc.title | Improve Fourier transform profilometry by locally area modulating squared binary structured pattern | |
| dc.type | article | |
| dc.type.genre | conference | |
| dspace.entity.type | Publication | |
| relation.isOrgUnitOfPublication | 6d38ab0f-8cc2-4ad3-90b1-67a60c5a6f59 |
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