Development Programs for One-Shot Systems Using Multiple-State Design Reliability Models

Date
2002-10-01
Authors
Shevasuthisilp, Suntichai
Vardeman, Stephen
Vardeman, Stephen
Major Professor
Advisor
Committee Member
Journal Title
Journal ISSN
Volume Title
Publisher
Altmetrics
Authors
Research Projects
Organizational Units
Statistics
Organizational Unit
Journal Issue
Series
Department
Statistics
Abstract

Design reliability at the beginning of a product development program is typically low and development costs can account for a large proportion of total product cost. We consider how to conduct development programs (series of tests and redesigns) for one-shot systems (which are destroyed at first use or during testing). In rough terms, our aim is to both achieve high final design reliability and spend as little of a fixed budget as possible on development. We employ multiple-state reliability models. Dynamic programming is used to identify a best test-and-redesign strategy and is shown to be presently computationally feasible for at least 5-state models. Our analysis is flexible enough to allow for the accelerated stress testing needed in the case of ultra-high reliability requirements, where testing otherwise provides little information on design reliability change.

Comments

This preprint was published as Suntichai Shevasuthislp & Stephen B. Vardeman, "Development Programs for One-Shot Systems Using Multiple-State Design Reliability Models", Naval Research Logistics (2004): 873-892, doi: 10.1002/nav.20033.

Description
Keywords
Citation
DOI
Source
Collections