Lorentz transmission electron microscopy and magnetic force microscopy characterization of NiFe/Al-oxide/Co films

dc.contributor.author Yu, Andrew
dc.contributor.author Lo, Chester
dc.contributor.author Petford-Long, Amanda
dc.contributor.author Jiles, David
dc.contributor.author Miyazaki, Terunobu
dc.contributor.department Materials Science and Engineering
dc.date 2018-02-14T10:12:58.000
dc.date.accessioned 2020-06-30T06:06:36Z
dc.date.available 2020-06-30T06:06:36Z
dc.date.copyright Tue Jan 01 00:00:00 UTC 2002
dc.date.embargo 2013-09-18
dc.date.issued 2002-01-15
dc.description.abstract <p>Magnetization reversal process of NiFe/Al-oxide/Co junction films was observed directly using Lorentztransmission electron microscopy (LTEM) and magnetic force microscopy(MFM).<em>In situ</em>magnetizing experiments performed in both LTEM and MFM were facilitated by a pair of electromagnets, which were mounted on the sample stages. A two-stage magnetization reversal process for the junction film was clearly observed in LTEM with NiFe magnetization reversed first via domain wall motion followed by Co magnetization reversal via moment rotation and domain wall motion. Reversal mechanism and domain characteristics of the NiFe and Co layers showed very distinctive features. The magnetization curve of the junction filmmeasured using alternating gradient force magnetometry showed a nonzero slope at the antiparallel magnetization configuration region, which implies that magnetization directions of the NiFe and Co layers were not exactly antiparallel due to Co moment rotation existed in that region. After the magnetization reversal of the Co was complete, MFM images revealed some magnetic contrast, which suggests that an out-of-plane magnetization component remained in the Co layer. Such magnetic contrast disappeared at higher magnetic fields when the Co moments further rotated and aligned parallel to the applied field direction.</p>
dc.description.comments <p>The following article appeared in <em>Journal of Applied Physics</em> 91 (2002): 780 and may be found at <a href="http://dx.doi.org/10.1063/1.1427142" target="_blank">http://dx.doi.org/10.1063/1.1427142</a>.</p>
dc.format.mimetype application/pdf
dc.identifier archive/lib.dr.iastate.edu/mse_pubs/108/
dc.identifier.articleid 1106
dc.identifier.contextkey 6004743
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath mse_pubs/108
dc.identifier.uri https://dr.lib.iastate.edu/handle/20.500.12876/55434
dc.language.iso en
dc.source.bitstream archive/lib.dr.iastate.edu/mse_pubs/108/2002_Yu_LorentzTransmission.pdf|||Fri Jan 14 18:28:12 UTC 2022
dc.source.uri 10.1063/1.1427142
dc.subject.disciplines Electromagnetics and Photonics
dc.subject.disciplines Engineering Physics
dc.subject.keywords Ames Laboratory
dc.subject.keywords Magnetic force microscopy
dc.subject.keywords Magnetic films
dc.subject.keywords Magnetization reversals
dc.subject.keywords Domain walls
dc.subject.keywords Lorentz group
dc.title Lorentz transmission electron microscopy and magnetic force microscopy characterization of NiFe/Al-oxide/Co films
dc.type article
dc.type.genre article
dspace.entity.type Publication
relation.isAuthorOfPublication cb9622ce-98bb-47c3-bc98-8ac772e1c44e
relation.isOrgUnitOfPublication bf9f7e3e-25bd-44d3-b49c-ed98372dee5e
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