Reflection Coefficients for Defective Diffusion Bonds

dc.contributor.author	Rose, James
dc.date	2018-02-14T05:15:34.000
dc.date.accessioned	2020-06-30T06:36:26Z
dc.date.available	2020-06-30T06:36:26Z
dc.date.copyright	Mon Jan 01 00:00:00 UTC 1990
dc.date.issued	1990
dc.description.abstract	<p>The quality of diffusion bonds can, to some degree, be characterized using ultrasonic probes. Consequently, considerable effort has gone into the development of theories that predict the ultrasonic scattering from defective bonds. There are three major lines of development. First Baik and Thompson [1] and Angel and Achenbach [2] have examined the low frequency limit; they have described the elastic scattering by an “effective” spring-model in this regime. Second Sotiropolous and Achenbach [3,4] have developed a rigorous approach that is valid at all frequencies for the case of microcracks at the bondplane; the crucial theoretical tool in this case is the crack opening displacement. Their work is, however, restricted to the case of normally incident plane waves. Rose [5] presented an approximate method, the single scattering approximation, for computing the reflection coefficients at normal incidence; it is based on using the scattering amplitudes for the various defects at the bondplane.</p>
dc.format.mimetype	application/pdf
dc.identifier	archive/lib.dr.iastate.edu/qnde/1990/allcontent/169/
dc.identifier.articleid	2207
dc.identifier.contextkey	5793245
dc.identifier.s3bucket	isulib-bepress-aws-west
dc.identifier.submissionpath	qnde/1990/allcontent/169
dc.identifier.uri	https://dr.lib.iastate.edu/handle/20.500.12876/59551
dc.language.iso	en
dc.source.bitstream	archive/lib.dr.iastate.edu/qnde/1990/allcontent/169/1990_RoseJH_ReflectionCoefficients.pdf\|\|\|Fri Jan 14 21:07:33 UTC 2022
dc.source.uri	10.1007/978-1-4684-5772-8_169
dc.subject.keywords	Ames Laboratory
dc.title	Reflection Coefficients for Defective Diffusion Bonds
dc.type	event
dc.type.genre	article
dspace.entity.type	Publication

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