Reflection Coefficients for Defective Diffusion Bonds

dc.contributor.author Rose, James
dc.date 2018-02-14T05:15:34.000
dc.date.accessioned 2020-06-30T06:36:26Z
dc.date.available 2020-06-30T06:36:26Z
dc.date.copyright Mon Jan 01 00:00:00 UTC 1990
dc.date.issued 1990
dc.description.abstract <p>The quality of diffusion bonds can, to some degree, be characterized using ultrasonic probes. Consequently, considerable effort has gone into the development of theories that predict the ultrasonic scattering from defective bonds. There are three major lines of development. First Baik and Thompson [1] and Angel and Achenbach [2] have examined the low frequency limit; they have described the elastic scattering by an “effective” spring-model in this regime. Second Sotiropolous and Achenbach [3,4] have developed a rigorous approach that is valid at all frequencies for the case of microcracks at the bondplane; the crucial theoretical tool in this case is the crack opening displacement. Their work is, however, restricted to the case of normally incident plane waves. Rose [5] presented an approximate method, the single scattering approximation, for computing the reflection coefficients at normal incidence; it is based on using the scattering amplitudes for the various defects at the bondplane.</p>
dc.format.mimetype application/pdf
dc.identifier archive/lib.dr.iastate.edu/qnde/1990/allcontent/169/
dc.identifier.articleid 2207
dc.identifier.contextkey 5793245
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath qnde/1990/allcontent/169
dc.identifier.uri https://dr.lib.iastate.edu/handle/20.500.12876/59551
dc.language.iso en
dc.source.bitstream archive/lib.dr.iastate.edu/qnde/1990/allcontent/169/1990_RoseJH_ReflectionCoefficients.pdf|||Fri Jan 14 21:07:33 UTC 2022
dc.source.uri 10.1007/978-1-4684-5772-8_169
dc.subject.keywords Ames Laboratory
dc.title Reflection Coefficients for Defective Diffusion Bonds
dc.type event
dc.type.genre article
dspace.entity.type Publication
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