Relative Reluctances in Thick Aluminum Samples

dc.contributor.author Schmidt, William
dc.contributor.author Zinke, Otto
dc.date 2018-02-14T06:01:14.000
dc.date.accessioned 2020-06-30T06:42:59Z
dc.date.available 2020-06-30T06:42:59Z
dc.date.copyright Sun Jan 01 00:00:00 UTC 1995
dc.date.issued 1995
dc.description.abstract <p>The effects of sample thicknesses, frequencies, and values of lift-off on real and imaginary reluctances for a modified ac magnetic bridge were found for aluminum. Aluminum test samples with thicknesses varying between 0.406 and 6.35 millimeters were scanned at values of lift-off ranging from 0.1 to 0.38 millimeters and at frequencies between 200 and 5000 Hz.</p>
dc.format.mimetype application/pdf
dc.identifier archive/lib.dr.iastate.edu/qnde/1995/allcontent/221/
dc.identifier.articleid 2582
dc.identifier.contextkey 5800169
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath qnde/1995/allcontent/221
dc.identifier.uri https://dr.lib.iastate.edu/handle/20.500.12876/60484
dc.language.iso en
dc.relation.ispartofseries Review of Progress in Quantitative Nondestructive Evaluation
dc.source.bitstream archive/lib.dr.iastate.edu/qnde/1995/allcontent/221/1995_Schmidt_RelativeReluctances.pdf|||Fri Jan 14 22:42:03 UTC 2022
dc.source.uri 10.1007/978-1-4615-1987-4_221
dc.title Relative Reluctances in Thick Aluminum Samples
dc.type event
dc.type.genre article
dspace.entity.type Publication
relation.isSeriesOfPublication 289a28b5-887e-4ddb-8c51-a88d07ebc3f3
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