Application of the X-ray measurement model to image processing of X-ray radiographs
Application of the X-ray measurement model to image processing of X-ray radiographs
dc.contributor.author | Siwek, Elizabeth | |
dc.contributor.department | Electrical and Computer Engineering | |
dc.date | 2018-08-24T19:44:28.000 | |
dc.date.accessioned | 2020-06-30T08:20:27Z | |
dc.date.available | 2020-06-30T08:20:27Z | |
dc.date.copyright | Sat Jan 01 00:00:00 UTC 1994 | |
dc.date.embargo | 2013-12-13 | |
dc.date.issued | 1994 | |
dc.description.abstract | <p>Information can be conveyed in many forms, yet it is perhaps easiest interpreted when in a visual form. The human mind has the ability to look at a scene containing complex patterns and extract particular features by considering the content of the entire image and focusing on the items of interest. The processing power, speed to decipher images, and complexity of the human brain has yet to be matched by any artificial means. Although the brain is a excellent processor and interpreter, a human can tire and become less accurate with time, potentially causing costly errors. Since consistency is especially important in inspection situations, it is desirable to automate part or all of the vision process to simplify the inspection. Thus, images can be acquired and processed to improve image quality for either human interpretation or machine perception and analysis. With image processing, it is possible to remove patterns or artifacts induced by the testing equipment, or to seek particular features for enhancement or extraction. The use of imaging technologies facilitates quantitative analysis and objective interpretation of selected parameters, especially in repetitive tasks.</p> | |
dc.format.mimetype | application/pdf | |
dc.identifier | archive/lib.dr.iastate.edu/rtd/255/ | |
dc.identifier.articleid | 1255 | |
dc.identifier.contextkey | 4922605 | |
dc.identifier.doi | https://doi.org/10.31274/rtd-180813-5578 | |
dc.identifier.s3bucket | isulib-bepress-aws-west | |
dc.identifier.submissionpath | rtd/255 | |
dc.identifier.uri | https://dr.lib.iastate.edu/handle/20.500.12876/74115 | |
dc.language.iso | en | |
dc.source.bitstream | archive/lib.dr.iastate.edu/rtd/255/1994_SiwekEM_ApplicationXray.pdf|||Fri Jan 14 22:58:34 UTC 2022 | |
dc.subject.disciplines | Electrical and Computer Engineering | |
dc.subject.disciplines | Electrical and Electronics | |
dc.subject.keywords | CNDE | |
dc.subject.keywords | Nondestructive Evaluation | |
dc.title | Application of the X-ray measurement model to image processing of X-ray radiographs | |
dc.type | article | |
dc.type.genre | thesis | |
dspace.entity.type | Publication | |
relation.isOrgUnitOfPublication | a75a044c-d11e-44cd-af4f-dab1d83339ff | |
thesis.degree.level | thesis | |
thesis.degree.name | Master of Science |
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