Point Matching Method for Flaw Detection in Printed Circuit Boards

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dc.contributor.author Donahue, M.
dc.contributor.author Sprague, A.
dc.contributor.author Rokhlin, S.
dc.date 2018-02-14T05:36:10.000
dc.date.accessioned 2020-06-30T06:34:18Z
dc.date.available 2020-06-30T06:34:18Z
dc.date.copyright Sun Jan 01 00:00:00 UTC 1989
dc.date.issued 1989
dc.description.abstract <p>There is high demand in industry for automated inspection of printed circuit boards (PCB’s). The major requirements for inspection systems are high speed, universality and high precision of inspection. Two major approaches have been used in the past: the reference-comparison and the design-rule verification methods. Each of them has its limitations and advantages. Recently, several authors have described algorithms which integrate both the reference-comparison and the design-rule methods [1–4].</p>
dc.format.mimetype application/pdf
dc.identifier archive/lib.dr.iastate.edu/qnde/1989/allcontent/154/
dc.identifier.articleid 2380
dc.identifier.contextkey 5799492
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath qnde/1989/allcontent/154
dc.identifier.uri https://dr.lib.iastate.edu/handle/20.500.12876/59247
dc.language.iso en
dc.relation.ispartofseries Review of Progress in Quantitative Nondestructive Evaluation
dc.source.bitstream archive/lib.dr.iastate.edu/qnde/1989/allcontent/154/1989_Donahue_PointMatching.pdf|||Fri Jan 14 20:40:17 UTC 2022
dc.source.uri 10.1007/978-1-4613-0817-1_154
dc.subject.disciplines Electronic Devices and Semiconductor Manufacturing
dc.title Point Matching Method for Flaw Detection in Printed Circuit Boards
dc.type event
dc.type.genre article
dspace.entity.type Publication
relation.isSeriesOfPublication 289a28b5-887e-4ddb-8c51-a88d07ebc3f3
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