Novel X-Ray Imaging Method for Evaluating Defect Evolution in Ceramic Tapes
dc.contributor.author | Maranville, C. | |
dc.contributor.author | Gray, Joseph | |
dc.contributor.author | Schilling, C. | |
dc.date | 2018-02-14T07:33:02.000 | |
dc.date.accessioned | 2020-06-30T06:45:52Z | |
dc.date.available | 2020-06-30T06:45:52Z | |
dc.date.copyright | Mon Jan 01 00:00:00 UTC 1996 | |
dc.date.issued | 1996 | |
dc.description.abstract | <p>Ceramic tape casting is critical to the electronics industry for manufacturing a wide range of components including piezoelectric actuators, MLC capacitors, and substrates for VLSI and LSI chips [1–3]. Recent regulatory changes, led by the Environmental Protection Agency concerning hazardous chemicals used in ceramic tape-casting, have renewed interest in the development of environmentally-friendly modifications to this process. In turn, this has increased interest in developing a better, fundamental understanding of how microstructural defects form and evolve during the sequence of processing steps associated with tape casting. In order to form more reliable electronic components, there is a need to develop a better, basic understanding of how to eliminate these defects by optimizing critical processing variables.</p> | |
dc.format.mimetype | application/pdf | |
dc.identifier | archive/lib.dr.iastate.edu/qnde/1996/allcontent/305/ | |
dc.identifier.articleid | 3349 | |
dc.identifier.contextkey | 5807676 | |
dc.identifier.s3bucket | isulib-bepress-aws-west | |
dc.identifier.submissionpath | qnde/1996/allcontent/305 | |
dc.identifier.uri | https://dr.lib.iastate.edu/handle/20.500.12876/60888 | |
dc.language.iso | en | |
dc.relation.ispartofseries | Review of Progress in Quantitative Nondestructive Evaluation | |
dc.source.bitstream | archive/lib.dr.iastate.edu/qnde/1996/allcontent/305/1996_Kennedy_BulkWave.pdf|||Fri Jan 14 23:28:55 UTC 2022 | |
dc.source.uri | 10.1007/978-1-4613-0383-1_305 | |
dc.subject.disciplines | Process Control and Systems | |
dc.subject.keywords | CNDE | |
dc.subject.keywords | Ames Laboratory | |
dc.subject.keywords | Materials Science and Engineering | |
dc.title | Novel X-Ray Imaging Method for Evaluating Defect Evolution in Ceramic Tapes | |
dc.type | event | |
dc.type.genre | article | |
dspace.entity.type | Publication | |
relation.isSeriesOfPublication | 289a28b5-887e-4ddb-8c51-a88d07ebc3f3 |
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