Analysis of the mutual inductance between two parallel plates for the detection of surface flaws

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dc.contributor.author Namkung, M.
dc.contributor.author Clendenin, C.
dc.contributor.author Fulton, J.
dc.contributor.author Wincheski, Buzz
dc.date 2018-02-14T03:06:33.000
dc.date.accessioned 2020-06-30T06:40:13Z
dc.date.available 2020-06-30T06:40:13Z
dc.date.copyright Fri Jan 01 00:00:00 UTC 1993
dc.date.issued 1993
dc.description.abstract <p>There has recently been much effort behind the development of NDE methods applicable to the detection of surface/subsurface flaws in thin metallic structures with a rapid scan capability. One such method, an electromagnetic technique using a current-sheet parallel to the surface of a specimen in order to induce eddy current flow shows a high potential for satisfying the rapid scan requirement stated above. The technique is based on the detection of flaw-induced magnetic field components normal to the specimen surface by an appropriate detection mechanism positioned above the current-sheet as shown schematically in Fig. 1. As indicated in this figure, the current-sheet separates the source of the normal magnetic field components from the detector in such a way that the electric and magnetic properties of the current-sheet can be a major factor affecting the strength of the detected signals. The purpose of the present study is, therefore, to perform a detailed investigation on the effect of the material properties of the current-sheet on the detected signal strength and to establish a simple theoretical model for the detection mechanism.</p>
dc.format.mimetype application/pdf
dc.identifier archive/lib.dr.iastate.edu/qnde/1993/allcontent/137/
dc.identifier.articleid 1374
dc.identifier.contextkey 5774149
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath qnde/1993/allcontent/137
dc.identifier.uri https://dr.lib.iastate.edu/handle/20.500.12876/60088
dc.language.iso en
dc.source.bitstream archive/lib.dr.iastate.edu/qnde/1993/allcontent/137/1993_Namkung_AnalysisMutual.pdf|||Fri Jan 14 19:58:42 UTC 2022
dc.source.uri 10.1007/978-1-4615-2848-7_137
dc.subject.disciplines Electromagnetics and Photonics
dc.title Analysis of the mutual inductance between two parallel plates for the detection of surface flaws
dc.type event
dc.type.genre article
dspace.entity.type Publication
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