Methods For Planning Accelerated Repeated Measures Degradation Tests

dc.contributor.author Weaver, Brian
dc.contributor.author Meeker, William
dc.contributor.author Meeker, William
dc.contributor.department Statistics
dc.date 2018-02-16T21:19:58.000
dc.date.accessioned 2020-07-02T06:56:24Z
dc.date.available 2020-07-02T06:56:24Z
dc.date.issued 2013-09-01
dc.description.abstract <p>Accelerated repeated measures degradation tests can sometimes be used to assess product or component reliability when one would expect few or even no failures during a study. Such tests can be used to estimate the lifetime distributions of highly reliable items. This paper describes methods for selecting a single-variable accelerated repeated measures degradation test plan when the (possibly transformed) degradation is linear in (possibly transformed) time and unit-to-unit variability is described by a random effect. To find optimum test plans, we use a criterion based on a large-sample approximation to the estimation precision of the quantile of the failure-time distribution at use conditions. We also discuss how to find compromise test plans that satisfy practical constraints. We use the general equivalence theorem to verify that a test plan is globally optimum. The resulting optimized plans are also evaluated using simulation and compared with other test plans.</p>
dc.description.comments <p>This preprint was published as Brian P. Weaver and William Q. Meeker, "Methods for Planning Repeated Measures Accelerated Degradation Tests", <em>Applied Stochastic Models in Business and Industry</em> (2014): 658-671, doi: <a href="http://dx.doi.org/10.1002/asmb.2061" target="_blank">10.1002/asmb.2061</a>.</p>
dc.identifier archive/lib.dr.iastate.edu/stat_las_preprints/80/
dc.identifier.articleid 1087
dc.identifier.contextkey 7438882
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath stat_las_preprints/80
dc.identifier.uri https://dr.lib.iastate.edu/handle/20.500.12876/90377
dc.language.iso en
dc.source.bitstream archive/lib.dr.iastate.edu/stat_las_preprints/80/2013_MeekerWQ_MethodsPlanningAccelerated.pdf|||Sat Jan 15 02:04:37 UTC 2022
dc.subject.disciplines Statistics and Probability
dc.subject.keywords nondestructive degradation
dc.subject.keywords mixed effects linear models
dc.subject.keywords accelerated degradation testing
dc.subject.keywords general equivalence theorem
dc.title Methods For Planning Accelerated Repeated Measures Degradation Tests
dc.type article
dc.type.genre article
dspace.entity.type Publication
relation.isAuthorOfPublication a1ae45d5-fca5-4709-bed9-3dd8efdba54e
relation.isOrgUnitOfPublication 264904d9-9e66-4169-8e11-034e537ddbca
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