TMS Effect on Growth Rate of N27 Neuron Cells Meng, Yiwen
dc.contributor.department Electrical and Computer Engineering 2018-02-14T10:04:51.000 2020-07-07T05:10:50Z 2020-07-07T05:10:50Z 2014-04-15
dc.description.abstract <p>Transcranial magnetic stimulation (TMS) is a non-invasive method for modulating neurons in the brain. The technique has been investigated for a variety of diagnostic and therapeutic applications for neurological disorders such as Parkinson's disease and Post-Traumatic Stress Disorder (PTSD). TMS treatment has been approved by US Food and Drug Administration for the treatment of depression; however, the effect of TMS on individual neurons is least understood. We first carried out the experiment to investigate the effect of magnetic field on the growth rate of neuronal cells. N27 cell is one type of dopaminergic neuronal cells from the brain of mice. We first cultured the cells in the incubator. After that, we used the air-cooled double coil to treat them at specific growing period with short pulses of time varying magnetic field. Each treatment was 30 minutes long. We counted the number of cells 24 hours after the TMS treatment to ensure enough time was given to see the effect on the growth of N27 cells. After using three different cell counting methods, we found the grow rate of N27 cells increased with upward oriented magnetic field treatment while it decreased with downward oriented magnetic field treatment.</p>
dc.identifier archive/
dc.identifier.articleid 1080
dc.identifier.contextkey 5914645
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath undergradresearch_symposium/2014/presentations/81
dc.relation.ispartofseries Symposium on Undergraduate Research and Creative Expression
dc.source.bitstream archive/|||Sat Jan 15 02:06:09 UTC 2022
dc.subject.disciplines Electromagnetics and Photonics
dc.title TMS Effect on Growth Rate of N27 Neuron Cells
dc.type event
dc.type.genre article
dspace.entity.type Publication
relation.isOrgUnitOfPublication a75a044c-d11e-44cd-af4f-dab1d83339ff
relation.isSeriesOfPublication 6730f354-97b8-4408-bad3-7e5c3b2fca9d Electrical Engineering
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