Capacitive sensor array for nondestructive evaluation applications

dc.contributor.advisor John P. Basart
dc.contributor.author Akour, Amneh
dc.contributor.department Electrical and Computer Engineering
dc.contributor.other Electrical and Computer Engineering
dc.date 2018-08-24T20:04:00.000
dc.date.accessioned 2020-06-30T07:06:07Z
dc.date.available 2020-06-30T07:06:07Z
dc.date.embargo 2013-06-08
dc.date.issued 1997
dc.description.abstract <p>Electromagnetic sensors come in different versions: capacitive, inductive, microwave, optics, etc. Eddy current probes (inductive sensors) have been used for decades in nondestructive evaluation (NDE) applications to detect flaws in conducting objects. Inductive probes are discussed by Rosegreen and Cooley (Bahr, and Rosegreen, 1987; Bahr, 1982; Bahr, and Cooley, 1983; Bahr, 1985). Capacitive sensors have been widely used for many decades also, but these applications have been based on extremely simple physical concepts; there has been no attempt to exploit the sophisticated sensing capabilities of generalized electric field probes. In NDE, there is a requirement to know not only how a probe behaves analytically under different probe geometry transformations, but also how a probe interacts with objects of different shapes and material properties.</p>
dc.format.mimetype application/pdf
dc.identifier archive/lib.dr.iastate.edu/rtd/106/
dc.identifier.articleid 1106
dc.identifier.contextkey 4208790
dc.identifier.doi https://doi.org/10.31274/rtd-180813-5828
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath rtd/106
dc.identifier.uri https://dr.lib.iastate.edu/handle/20.500.12876/63763
dc.source.bitstream archive/lib.dr.iastate.edu/rtd/106/1997AkourAM_CapacitiveSensorArray.pdf|||Fri Jan 14 18:24:03 UTC 2022
dc.subject CNDE
dc.title Capacitive sensor array for nondestructive evaluation applications
dc.type thesis
dspace.entity.type Publication
relation.isOrgUnitOfPublication a75a044c-d11e-44cd-af4f-dab1d83339ff
thesis.degree.level Master of Science
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