Addressing multi-bit errors in DRAM/memory subsystem

dc.contributor.advisor Arun K. Somani
dc.contributor.author Yeleswarapu, Ravikiran
dc.contributor.department Department of Electrical and Computer Engineering
dc.date 2020-10-22T20:33:09.000
dc.date.accessioned 2021-02-25T21:37:32Z
dc.date.available 2021-02-25T21:37:32Z
dc.date.copyright Wed Jan 01 00:00:00 UTC 2020
dc.date.embargo 2020-06-01
dc.date.issued 2020-01-01
dc.description.abstract <p>As DRAM technology continues to evolve towards smaller feature sizes and increased densities, faults in DRAM subsystem are becoming more severe. Current servers mostly use CHIPKILL based schemes to tolerate up-to one/two symbol errors per DRAM beat. Such schemes may not detect multi-symbol errors arising due to faults in multiple data buses and/or chips. In this work, we introduce Single Symbol Correction Multiple Symbol Detection (SSCMSD) - a novel error handling scheme to correct single-symbol errors and detect multi-symbol errors. Our scheme makes use of a hash in combination with Error Correcting Code (ECC) to avoid silent data corruptions (SDCs). SSCMSD also enhances the capability of detecting errors in address bits.</p> <p>We develop a novel scheme that deploys 32-bit CRC along with Reed-Solomon code to implement SSCMSD for a x4 based DDRx system. Simulation based experiments show that our scheme effectively prevents SDCs in the presence of multi-symbol errors (in data) as well as address bit errors only limited by the aliasing probability of the hash. Our novel design enabled us to achieve this without introducing additional READ latency. We need 19 chips per rank (storage overhead of 18.75 percent), 76 data bus-lines and additional hash-logic at the memory controller.</p>
dc.format.mimetype application/pdf
dc.identifier archive/lib.dr.iastate.edu/etd/18263/
dc.identifier.articleid 9270
dc.identifier.contextkey 19922011
dc.identifier.doi https://doi.org/10.31274/etd-20201022-0
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath etd/18263
dc.identifier.uri https://dr.lib.iastate.edu/handle/20.500.12876/94415
dc.language.iso en
dc.source.bitstream archive/lib.dr.iastate.edu/etd/18263/Yeleswarapu_iastate_0097E_18669.pdf|||Fri Jan 14 21:39:20 UTC 2022
dc.subject.disciplines Computer Engineering
dc.subject.disciplines Computer Sciences
dc.subject.keywords Address Errors
dc.subject.keywords DRAM reliability
dc.subject.keywords ECC
dc.subject.keywords Hash
dc.subject.keywords Memory
dc.subject.keywords Reed Solomon code
dc.title Addressing multi-bit errors in DRAM/memory subsystem
dc.type dissertation
dc.type.genre dissertation
dspace.entity.type Publication
relation.isOrgUnitOfPublication a75a044c-d11e-44cd-af4f-dab1d83339ff
thesis.degree.discipline Computer Engineering
thesis.degree.level dissertation
thesis.degree.name Doctor of Philosophy
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