Role of Nanoscale Roughness and Polarity in Odd-Even Effect of Self-Assembled Monolayers

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Du, Chuanshen
Wang, Zhengjia
Chen, Jiahao
Martin, Andrew
Raturi, Dhruv
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Wiley-VCH GmbH, Weinheim
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Materials Science and Engineering

The Department of Materials Science and Engineering teaches the composition, microstructure, and processing of materials as well as their properties, uses, and performance. These fields of research utilize technologies in metals, ceramics, polymers, composites, and electronic materials.

The Department of Materials Science and Engineering was formed in 1975 from the merger of the Department of Ceramics Engineering and the Department of Metallurgical Engineering.

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Electrical and Computer Engineering

The Department of Electrical and Computer Engineering (ECpE) contains two focuses. The focus on Electrical Engineering teaches students in the fields of control systems, electromagnetics and non-destructive evaluation, microelectronics, electric power & energy systems, and the like. The Computer Engineering focus teaches in the fields of software systems, embedded systems, networking, information security, computer architecture, etc.

The Department of Electrical Engineering was formed in 1909 from the division of the Department of Physics and Electrical Engineering. In 1985 its name changed to Department of Electrical Engineering and Computer Engineering. In 1995 it became the Department of Electrical and Computer Engineering.

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  • Department of Electrical Engineering (1909-1985)
  • Department of Electrical Engineering and Computer Engineering (1985-1995)

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The dependency of substrate roughness on wetting properties of self-assembled monolayers (SAMs) has been studied extensively, but most previous studies used limited selection of probing liquid and range of surface roughness. These studies disregarded the limit to observation of sub-nanometer odd-even parity effect, hence are inconclusive. In this work we report the role of solvent polarity on the roughness-dependency of wetting behavior of SAMs by studying static con-tact angle of a variety of probing liquids, with different polarities, on SAMs formed on Ag-based substrate with different surface morphology. By overlapping the roughness ranges with previous studies on Au, the limitation of surface roughness (RMS = 1 nm) to observation of the odd-even effect using water as probing liquid was confirmed, but other probing liquid yielded different roughness-dependent behaviors, with more polar solvent showing more roughness-dependent behavior. Based on these observations, we concluded that there exists a phase-transition like behavior in SAMs due to substrate roughness, molecule chain length whose determination is dependent on the probing liquid.
This is the peer-reviewed version of the following article: Du, Chuanshen, Zhengjia Scarlett Wang, Jiahao Chen, Andrew Martin, Dhruv Raturi, and Martin M. Thuo. "Role of Nanoscale Roughness and Polarity in Odd‐Even Effect of Self‐Assembled Monolayers." Angewandte Chemie International Edition, which has been published in final form at DOI: 10.1002/anie.202205251. This article may be used for non-commercial purposes in accordance with Wiley Terms and Conditions for Self-Archiving. Copyright 2022 Wiley-VCH GmbH, Weinheim. Posted with permission.