Atomic force microscopy and manipulation of living glial cells

Thumbnail Image
Date
1993
Authors
Haydon, P. G.
Sakaguchi, D. S.
Major Professor
Advisor
Committee Member
Journal Title
Journal ISSN
Volume Title
Publisher
Authors
Research Projects
Organizational Units
Organizational Unit
Journal Issue
Is Version Of
Versions
Series
Department
Zoology and Genetics
Abstract

The atomic force microscope (AFM) is capable of imaging surfaces at very high resolution. The AFM has been used to image living glial cells in culture. Typical images reveal the three‐dimensional shape of the cell and often internal cellular structures are visible. In this report, it is shown that by increasing the imaging force, cells can be removed from the surface on which they are grown. Although the forces involved in this process are complex, it is possible to compare relative adhesion of different types of living cells to a particular substrate.

Comments

This article is from Journal of Vacuum Science & Technology A 11 (1993): 773, doi: 10.1116/1.578346. Posted with permission.

Description
Keywords
Citation
DOI
Copyright
Fri Jan 01 00:00:00 UTC 1993
Collections