Morphological evolution of the fivefold surface of i-AlPdMn quasicrystals

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2002-05-28
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Cappello, Giovanni
Lograsso, Thomas
Chevrier, Joël
Schmithüsen, Frank
Stierle, Andreas
Formoso, Vincenzo
comin, Fabio
de Boissieu, Marc
Boudard, Michel
Lograsso, Thomas
Jenks, Cynthia
Delaney, Dwight
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Ames Laboratory
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Ames Laboratory
Abstract

Morphology of the fivefold symmetric quasicrystal surface of AlPdMn was investigated by x-ray reflectivity and by x-ray diffraction. X-ray experiments revealed two different morphologies depending on the surface preparation. Sputtering and annealing up to 900 K, under UHV conditions, produced a rough and facetted quasicrystal surface. These features were confirmed by atomic force microscopy and scanning tunnel microscopy measurements. We also observed that an annealing above 900 K induces a rapid and irreversible transition toward a flat surface.

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This article is from Physical Review B 65 (2002): 245405, doi:10.1103/PhysRevB.65.245405.

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