Morphological evolution of the fivefold surface of i-AlPdMn quasicrystals
de Boissieu, Marc
Morphology of the fivefold symmetric quasicrystal surface of AlPdMn was investigated by x-ray reflectivity and by x-ray diffraction. X-ray experiments revealed two different morphologies depending on the surface preparation. Sputtering and annealing up to 900 K, under UHV conditions, produced a rough and facetted quasicrystal surface. These features were confirmed by atomic force microscopy and scanning tunnel microscopy measurements. We also observed that an annealing above 900 K induces a rapid and irreversible transition toward a flat surface.
This article is from Physical Review B 65 (2002): 245405, doi:10.1103/PhysRevB.65.245405.