Clearer ECT Flaw Image Utilizing CT Inversion Technique

Date
1997
Authors
Hoshikawa, Hiroshi
Koyama, Kiyoshi
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Altmetrics
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Abstract

Eddy current imaging has been used in eddy current nondestructive testing in order to identify small surface flaws in conducting materials [1–5]. However, the conventional pancake coil probes provide blurred flaw images because the eddy current in the test material induced by the probe spreads over a larger area than the coil size. The authors first applied popular deconvolution method to blurred ECT flaw images to get clear flaw images. However, it did not work well because a small drill hole signal does not correlate linearly to slit flaw signals. So the authors have devised a new ECT method utilizing a tangential coil and computerized tomography inversion technique in order to obtain clearer ECT flaw images.

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