Fourier transform profilometry using a binary area modulation technique

Date
2012-11-02
Authors
Lohry, William
Zhang, Song
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Altmetrics
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Zhang, Song
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Research Projects
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Mechanical Engineering
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Abstract

A recent study found that it is very difficult to use the squared binary defocusing technique to eliminate the influence of third-order harmonics without compromising fringe quality, and thus it is challenging to utilize Fourier transform profilometry to achieve high-quality three-dimensional measurement. A novel approach is presented to effectively eliminate the third-order harmonics by modulating the squared binary structured patterns. Both simulation and experiments are presented to verify the performance of the proposed technique.

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This article is from Optical Engineering 51 (2012): 113602, doi:10.1117/1.OE.51.11.113602.

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