Fourier transform profilometry using a binary area modulation technique
A recent study found that it is very difficult to use the squared binary defocusing technique to eliminate the influence of third-order harmonics without compromising fringe quality, and thus it is challenging to utilize Fourier transform profilometry to achieve high-quality three-dimensional measurement. A novel approach is presented to effectively eliminate the third-order harmonics by modulating the squared binary structured patterns. Both simulation and experiments are presented to verify the performance of the proposed technique.
This article is from Optical Engineering 51 (2012): 113602, doi:10.1117/1.OE.51.11.113602.