In-Situ NDE of Navy Sonar Domes Via X-Ray Backscatter Tomography

Date
1995
Authors
Greenawald, Edward
Nagode, James
Poranski, Chester
Ham, Young
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Altmetrics
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Abstract

X-ray backscatter tomography (XBT) is a relatively new NDE technology which is quantitative in its ability to detect a flaw location in three dimensions. The volume to be inspected is interrogated by a collimated x-ray beam and one or more collimated detectors to measure the Compton scatter signal produced by each volume element. XBT is particularly useful where access is available only to one side of the object. Although a number of novel backscatter inspection techniques have been demonstrated [1–4], there is a notable dearth of real applications. This can be attributed to both the development of other, lower cost, one-sided methods and the lack, until recently, of a commercial XBT scanner. In applications where the low cost alternatives are inferior or unfeasible and failure costs are high, XBT affords a solution.

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