In-Situ NDE of Navy Sonar Domes Via X-Ray Backscatter Tomography Greenawald, Edward Nagode, James Poranski, Chester Ham, Young 2018-02-14T05:06:47.000 2020-06-30T06:42:07Z 2020-06-30T06:42:07Z Sun Jan 01 00:00:00 UTC 1995 1995
dc.description.abstract <p>X-ray backscatter tomography (XBT) is a relatively new NDE technology which is quantitative in its ability to detect a flaw location in three dimensions. The volume to be inspected is interrogated by a collimated x-ray beam and one or more collimated detectors to measure the Compton scatter signal produced by each volume element. XBT is particularly useful where access is available only to one side of the object. Although a number of novel backscatter inspection techniques have been demonstrated [1–4], there is a notable dearth of real applications. This can be attributed to both the development of other, lower cost, one-sided methods and the lack, until recently, of a commercial XBT scanner. In applications where the low cost alternatives are inferior or unfeasible and failure costs are high, XBT affords a solution.</p>
dc.format.mimetype application/pdf
dc.identifier archive/
dc.identifier.articleid 2132
dc.identifier.contextkey 5789463
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath qnde/1995/allcontent/110
dc.language.iso en
dc.source.bitstream archive/|||Fri Jan 14 18:39:47 UTC 2022
dc.source.uri 10.1007/978-1-4615-1987-4_110
dc.subject.disciplines Signal Processing
dc.title In-Situ NDE of Navy Sonar Domes Via X-Ray Backscatter Tomography
dc.type event
dc.type.genre article
dspace.entity.type Publication
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