Quantitative X-Ray Inspection

Date
1998
Authors
Retraint, F.
Dinten, J.
Campagnolo, R.
Peyrin, F.
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Altmetrics
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Research Projects
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Abstract

In a radiograph the value of each pixel is related to the material thickness crossed by the X-Rays. Using this relationship, a defect in an object can be located and furthermore characterized by parameters such as depth, surface and volume.

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