Quantitative X-Ray Inspection

dc.contributor.author Retraint, F.
dc.contributor.author Dinten, J.
dc.contributor.author Campagnolo, R.
dc.contributor.author Peyrin, F.
dc.date 2018-02-14T08:09:49.000
dc.date.accessioned 2020-06-30T06:49:51Z
dc.date.available 2020-06-30T06:49:51Z
dc.date.copyright Thu Jan 01 00:00:00 UTC 1998
dc.date.issued 1998
dc.description.abstract <p>In a radiograph the value of each pixel is related to the material thickness crossed by the X-Rays. Using this relationship, a defect in an object can be located and furthermore characterized by parameters such as depth, surface and volume.</p>
dc.format.mimetype application/pdf
dc.identifier archive/lib.dr.iastate.edu/qnde/1998/allcontent/46/
dc.identifier.articleid 3638
dc.identifier.contextkey 5810432
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath qnde/1998/allcontent/46
dc.identifier.uri https://dr.lib.iastate.edu/handle/20.500.12876/61462
dc.language.iso en
dc.source.bitstream archive/lib.dr.iastate.edu/qnde/1998/allcontent/46/1998_Retraint_QuantitativeXray.pdf|||Sat Jan 15 00:22:07 UTC 2022
dc.source.uri 10.1007/978-1-4615-5339-7_46
dc.title Quantitative X-Ray Inspection
dc.type event
dc.type.genre article
dspace.entity.type Publication
File
Original bundle
Now showing 1 - 1 of 1
Name:
1998_Retraint_QuantitativeXray.pdf
Size:
885.01 KB
Format:
Adobe Portable Document Format
Description: