Quantitative X-Ray Inspection

dc.contributor.author	Retraint, F.
dc.contributor.author	Dinten, J.
dc.contributor.author	Campagnolo, R.
dc.contributor.author	Peyrin, F.
dc.date	2018-02-14T08:09:49.000
dc.date.accessioned	2020-06-30T06:49:51Z
dc.date.available	2020-06-30T06:49:51Z
dc.date.copyright	Thu Jan 01 00:00:00 UTC 1998
dc.date.issued	1998
dc.description.abstract	<p>In a radiograph the value of each pixel is related to the material thickness crossed by the X-Rays. Using this relationship, a defect in an object can be located and furthermore characterized by parameters such as depth, surface and volume.</p>
dc.format.mimetype	application/pdf
dc.identifier	archive/lib.dr.iastate.edu/qnde/1998/allcontent/46/
dc.identifier.articleid	3638
dc.identifier.contextkey	5810432
dc.identifier.s3bucket	isulib-bepress-aws-west
dc.identifier.submissionpath	qnde/1998/allcontent/46
dc.identifier.uri	https://dr.lib.iastate.edu/handle/20.500.12876/61462
dc.language.iso	en
dc.source.bitstream	archive/lib.dr.iastate.edu/qnde/1998/allcontent/46/1998_Retraint_QuantitativeXray.pdf\|\|\|Sat Jan 15 00:22:07 UTC 2022
dc.source.uri	10.1007/978-1-4615-5339-7_46
dc.title	Quantitative X-Ray Inspection
dc.type	event
dc.type.genre	article
dspace.entity.type	Publication

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