Development of a scanning angle total internal reflection Raman spectrometer

dc.contributor.author McKee, Kristopher
dc.contributor.author Smith, Emily
dc.contributor.author Smith, Emily
dc.contributor.department Ames Laboratory
dc.contributor.department Chemistry
dc.date 2018-02-17T09:48:52.000
dc.date.accessioned 2020-06-30T01:23:49Z
dc.date.available 2020-06-30T01:23:49Z
dc.date.copyright Fri Jan 01 00:00:00 UTC 2010
dc.date.issued 2010-04-21
dc.description.abstract <p>A scanning angle total internal reflection (SATIR) Raman spectrometer has been developed for measuring interfacial phenomena with chemical specificity and high axial resolution perpendicular to the interface. The instrument platform is an inverted optical microscope with added automated variable angle optics to control the angle of an incident laser on a prism/sample interface. These optics include two motorized translation stages, the first containing a focusing lens and the second a variable angle galvanometer mirror. The movement of all instrument components is coordinated to ensure that the same sample location and area are probed at each angle. At angles greater than the critical angle, an evanescent wave capable of producing Raman scatter is generated in the sample. The Raman scatter is collected by a microscope objective and directed to a dispersive spectrometer and charge-coupled device detector. In addition to the collected Raman scatter, light reflected from the prism/sample interface is collected to provide calibration parameters that enable modeling the distance over which the Raman scatter is collected for depth profiling measurements. The developed instrument has an incident angle range of 25.5°–75.5°, with a 0.05° angle resolution. Raman scatter can be collected from a ZnSe/organic interface over a range of roughly 35–180 nm. Far from the critical angle, the achieved axial resolution perpendicular to the focal plane is approximately 34 nm. This is roughly a 30-fold improvement relative to confocal Raman microscopy.</p>
dc.description.comments <p>This is an article from <em>Review of Scientific Instruments</em>; 2010; 81:043106; doi: <a href="http://dx.doi.org/10.1063/1.3378682" target="_blank">10.1063/1.3378682</a>. Posted with permission.</p>
dc.format.mimetype application/pdf
dc.identifier archive/lib.dr.iastate.edu/chem_pubs/907/
dc.identifier.articleid 1903
dc.identifier.contextkey 7970260
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath chem_pubs/907
dc.identifier.uri https://dr.lib.iastate.edu/handle/20.500.12876/15408
dc.language.iso en
dc.source.bitstream archive/lib.dr.iastate.edu/chem_pubs/907/2010_SmithEA_DevelopmentScanningAngle.pdf|||Sat Jan 15 02:27:43 UTC 2022
dc.source.uri 10.1063/1.3378682
dc.subject.disciplines Chemistry
dc.subject.disciplines Materials Chemistry
dc.subject.disciplines Medicinal-Pharmaceutical Chemistry
dc.subject.disciplines Other Chemistry
dc.subject.disciplines Physical Chemistry
dc.title Development of a scanning angle total internal reflection Raman spectrometer
dc.type article
dc.type.genre article
dspace.entity.type Publication
relation.isAuthorOfPublication 1593ba6f-2eb3-4290-ab73-86b7601506fa
relation.isOrgUnitOfPublication 25913818-6714-4be5-89a6-f70c8facdf7e
relation.isOrgUnitOfPublication 42864f6e-7a3d-4be3-8b5a-0ae3c3830a11
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