Development programs for one-shot systems using multiple-state design reliability models

dc.contributor.advisor Stephen B. Vardeman Shevasuthisilp, Suntichai
dc.contributor.department Industrial and Manufacturing Systems Engineering 2018-08-25T00:50:56.000 2020-07-02T05:56:16Z 2020-07-02T05:56:16Z Mon Jan 01 00:00:00 UTC 2001 2001-01-01
dc.description.abstract <p>Design reliability at the beginning of a product development program is typically low and development costs account for a large proportion of the total product cost. Our research focuses on how to conduct "development programs" (series of tests and redesigns) to both achieve high final design reliability and spend as little of a fixed budget as possible on development. Multiple-state reliability models are used. We consider one-shot systems, which are destroyed at first use or during testing. Dynamic programming is used to identify the best test-and-redesign strategy and is shown to presently be computationally feasible for at least 5 state models. Our analysis is flexible enough to allow for accelerated testing in the case of ultra-high reliability requirements, where testing otherwise provides little information on design reliability growth.</p>
dc.format.mimetype application/pdf
dc.identifier archive/
dc.identifier.articleid 1674
dc.identifier.contextkey 6078108
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath rtd/675
dc.language.iso en
dc.source.bitstream archive/|||Sat Jan 15 01:27:55 UTC 2022
dc.subject.disciplines Industrial Engineering
dc.subject.keywords Industrial and manufacturing systems engineering
dc.subject.keywords Industrial engineering
dc.title Development programs for one-shot systems using multiple-state design reliability models
dc.type article
dc.type.genre dissertation
dspace.entity.type Publication
relation.isOrgUnitOfPublication 51d8b1a0-5b93-4ee8-990a-a0e04d3501b1 dissertation Doctor of Philosophy
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