Calibration, Error Analysis, and Ongoing Measurement Process Monitoring for Mass Spectrometry

Date
2006-01-01
Authors
Vardeman, Stephen
Wendelberger, Joanne
Wang, Lily
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Altmetrics
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Research Projects
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Statistics
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Abstract

We consider problems of quantifying and monitoring accuracy and precision of measurement in mass spectrometry, particularly in contexts where there is unavoidable day-to-day/period-to-period changes in instrument sensitivity. First, we consider the issue of estimating instrument sensitivity based on data from a typical calibration study. Simple method-of-moments methods, likelihood-based methods, and Bayes methods based on the one-way random effects model are illustrated. Then, we consider subsequently assessing the precision of an estimate of a mole fraction of a gas of interest in an unknown. Finally, we turn to the problem of ongoing measurement process monitoring and illustrate appropriate setup of Shewhart control charts in this application.

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This is an Accepted Manuscript of an article published by Taylor & Francis in Quality Engineering on February 15, 2007, available online: http://www.tandfonline.com/10.1080/08982110600567541.

Keywords
Device sensitivity, Variance components, Mixed effects, R, Bayes analysis, WinBUGS, Method-of-moments, REML, Specimen-to-specimen variation, Day-to-day variation, Estimated mole fraction, Propagation of error, Delta method, Standard error, Posterior distribution, Control limits
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