Calibration, Error Analysis, and Ongoing Measurement Process Monitoring for Mass Spectrometry
Calibration, Error Analysis, and Ongoing Measurement Process Monitoring for Mass Spectrometry
dc.contributor.author | Vardeman, Stephen | |
dc.contributor.author | Wendelberger, Joanne | |
dc.contributor.author | Wang, Lily | |
dc.contributor.author | Vardeman, Stephen | |
dc.contributor.department | Statistics | |
dc.contributor.department | Industrial and Manufacturing Systems Engineering | |
dc.date | 2018-02-18T14:06:48.000 | |
dc.date.accessioned | 2020-06-30T04:47:57Z | |
dc.date.available | 2020-06-30T04:47:57Z | |
dc.date.copyright | Sun Jan 01 00:00:00 UTC 2006 | |
dc.date.issued | 2006-01-01 | |
dc.description.abstract | <p>We consider problems of quantifying and monitoring accuracy and precision of measurement in mass spectrometry, particularly in contexts where there is unavoidable day-to-day/period-to-period changes in instrument sensitivity. First, we consider the issue of estimating instrument sensitivity based on data from a typical calibration study. Simple method-of-moments methods, likelihood-based methods, and Bayes methods based on the one-way random effects model are illustrated. Then, we consider subsequently assessing the precision of an estimate of a mole fraction of a gas of interest in an unknown. Finally, we turn to the problem of ongoing measurement process monitoring and illustrate appropriate setup of Shewhart control charts in this application.</p> | |
dc.description.comments | <p>This is an Accepted Manuscript of an article published by Taylor & Francis in Quality Engineering on February 15, 2007, available online: <a href="http://www.tandfonline.com/10.1080/08982110600567541" target="_blank">http://www.tandfonline.com/10.1080/08982110600567541</a>.</p> | |
dc.format.mimetype | application/pdf | |
dc.identifier | archive/lib.dr.iastate.edu/imse_pubs/145/ | |
dc.identifier.articleid | 1143 | |
dc.identifier.contextkey | 10328413 | |
dc.identifier.s3bucket | isulib-bepress-aws-west | |
dc.identifier.submissionpath | imse_pubs/145 | |
dc.identifier.uri | https://dr.lib.iastate.edu/handle/20.500.12876/44436 | |
dc.language.iso | en | |
dc.source.bitstream | archive/lib.dr.iastate.edu/imse_pubs/145/2006_Vardeman_CalibrationError.pdf|||Fri Jan 14 20:21:20 UTC 2022 | |
dc.source.uri | 10.1080/08982110600567541 | |
dc.subject.disciplines | Industrial Engineering | |
dc.subject.disciplines | Statistics and Probability | |
dc.subject.disciplines | Systems Engineering | |
dc.subject.keywords | Device sensitivity | |
dc.subject.keywords | Variance components | |
dc.subject.keywords | Mixed effects | |
dc.subject.keywords | R | |
dc.subject.keywords | Bayes analysis | |
dc.subject.keywords | WinBUGS | |
dc.subject.keywords | Method-of-moments | |
dc.subject.keywords | REML | |
dc.subject.keywords | Specimen-to-specimen variation | |
dc.subject.keywords | Day-to-day variation | |
dc.subject.keywords | Estimated mole fraction | |
dc.subject.keywords | Propagation of error | |
dc.subject.keywords | Delta method | |
dc.subject.keywords | Standard error | |
dc.subject.keywords | Posterior distribution | |
dc.subject.keywords | Control limits | |
dc.title | Calibration, Error Analysis, and Ongoing Measurement Process Monitoring for Mass Spectrometry | |
dc.type | article | |
dc.type.genre | article | |
dspace.entity.type | Publication | |
relation.isAuthorOfPublication | d398ec8c-7612-4286-b7b8-88f844f10410 | |
relation.isOrgUnitOfPublication | 264904d9-9e66-4169-8e11-034e537ddbca | |
relation.isOrgUnitOfPublication | 51d8b1a0-5b93-4ee8-990a-a0e04d3501b1 |
File
Original bundle
1 - 1 of 1
- Name:
- 2006_Vardeman_CalibrationError.pdf
- Size:
- 336.05 KB
- Format:
- Adobe Portable Document Format
- Description: