Calibration, Error Analysis, and Ongoing Measurement Process Monitoring for Mass Spectrometry Vardeman, Stephen Wendelberger, Joanne Wang, Lily Vardeman, Stephen
dc.contributor.department Statistics
dc.contributor.department Industrial and Manufacturing Systems Engineering 2018-02-18T14:06:48.000 2020-06-30T04:47:57Z 2020-06-30T04:47:57Z Sun Jan 01 00:00:00 UTC 2006 2006-01-01
dc.description.abstract <p>We consider problems of quantifying and monitoring accuracy and precision of measurement in mass spectrometry, particularly in contexts where there is unavoidable day-to-day/period-to-period changes in instrument sensitivity. First, we consider the issue of estimating instrument sensitivity based on data from a typical calibration study. Simple method-of-moments methods, likelihood-based methods, and Bayes methods based on the one-way random effects model are illustrated. Then, we consider subsequently assessing the precision of an estimate of a mole fraction of a gas of interest in an unknown. Finally, we turn to the problem of ongoing measurement process monitoring and illustrate appropriate setup of Shewhart control charts in this application.</p>
dc.description.comments <p>This is an Accepted Manuscript of an article published by Taylor & Francis in Quality Engineering on February 15, 2007, available online: <a href="" target="_blank"></a>.</p>
dc.format.mimetype application/pdf
dc.identifier archive/
dc.identifier.articleid 1143
dc.identifier.contextkey 10328413
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath imse_pubs/145
dc.language.iso en
dc.source.bitstream archive/|||Fri Jan 14 20:21:20 UTC 2022
dc.source.uri 10.1080/08982110600567541
dc.subject.disciplines Industrial Engineering
dc.subject.disciplines Statistics and Probability
dc.subject.disciplines Systems Engineering
dc.subject.keywords Device sensitivity
dc.subject.keywords Variance components
dc.subject.keywords Mixed effects
dc.subject.keywords R
dc.subject.keywords Bayes analysis
dc.subject.keywords WinBUGS
dc.subject.keywords Method-of-moments
dc.subject.keywords REML
dc.subject.keywords Specimen-to-specimen variation
dc.subject.keywords Day-to-day variation
dc.subject.keywords Estimated mole fraction
dc.subject.keywords Propagation of error
dc.subject.keywords Delta method
dc.subject.keywords Standard error
dc.subject.keywords Posterior distribution
dc.subject.keywords Control limits
dc.title Calibration, Error Analysis, and Ongoing Measurement Process Monitoring for Mass Spectrometry
dc.type article
dc.type.genre article
dspace.entity.type Publication
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relation.isOrgUnitOfPublication 51d8b1a0-5b93-4ee8-990a-a0e04d3501b1
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