Structural characterization of thin film photonic crystals

Date
2001-05-23
Authors
Subramania, G.
Constant, Kristen
Biswas, Rana
Constant, Kristen
Sigalas, M.
Ho, Kai-Ming
Major Professor
Advisor
Committee Member
Journal Title
Journal ISSN
Volume Title
Publisher
Altmetrics
Authors
Research Projects
Organizational Units
Journal Issue
Series
Department
Materials Science and Engineering
Abstract

We quantitatively analyze the structure of thin film inverse-opal photonic crystals composed of ordered arrays of air pores in a background of titania. Ordering of the sphere template and introduction of the titania background were performed simultaneously in the thin film photonic crystals. Nondestructive optical measurements of backfilling with high refractive index liquids, angle-resolved reflectivity, and optical spectroscopy were combined with band-structure calculations. The analysis reveals a thin film photonic crystal structure with a very high filling fraction (92–94 %) of air and a substantial compression along the c axis (∼22–25%).

Comments

This article is from Physical Review B 63 (2001): 235111, doi:10.1103/PhysRevB.63.235111. Posted with permission.

Description
Keywords
Citation
DOI
Collections