Measurement of Acoustoelastic Coefficient of Surface Waves with Scanning Acoustic Microscope

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1995
Authors
Okade, Motohiro
Mizuno, Kiyofumi
Kawashima, Koichiro
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Altmetrics
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Abstract

A Scanning Acoustic Microscope (SAM) is a device used to identify the difference of the local acoustic properties at surface or subsurface of solid materials using high frequency surface wave, usually above 100 MHz. The major function of the SAM is to visualize the internal microstructures of materials. The other is to measure the surface wave velocity with the V(Z) curve. If the surface wave velocity could be accurately measured using the V(Z) curve, it is possible to evaluate the surface stresses within very localized region with the acoustoelastic law.

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