Modulation spectroscopy at non‐normal incidence with emphasis on the vacuum‐uv spectral region

Date
1976
Authors
Aspnes, D. E.
Lynch, David
Olson, C. G.
Lynch, David
Journal Title
Journal ISSN
Volume Title
Publisher
Source URI
Altmetrics
Authors
Research Projects
Organizational Units
Physics and Astronomy
Organizational Unit
Journal Issue
Series
Abstract

Expressions are given to analyze modulation spectra taken at non‐normal incidence. These expressions are used to determine the optimum angle of incidence to maximize the signal‐to‐noise ratio. Significant improvements are shown to be obtained in the vacuum‐uv spectral region by making measurements at relatively large angles of incidence. We apply these expressions to evaluate the field‐induced change in the dielectric function for the 20.5–21.0‐eV core‐level doublet in GaP from Schottky‐barrier electroreflectance data. The line shape obtained is consistent with that of a field‐modulated M 0critical point modified by a Coulomb attraction between the core hole and the excited electron.

Description
<p>The following article appeared in <em>Journal of Applied Physics </em>47 (1976): 602 and may be found at doi:<a href="http://dx.doi.org/10.1063/1.322620" target="_blank">10.1063/1.322620</a>.</p>
Keywords
Ames Laboratory, Critical point phenomena, dielectric function, spectrum analysis
Citation
Collections