Numerical Simulation of Flaw Detection with a Capacitive Array Sensor Using Finite and Infinite Elements

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1989
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Heyliger, P.
Moulder, J.
Nakagawa, Norio
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Review of Progress in Quantitative Nondestructive Evaluation
Center for Nondestructive Evaluation

Begun in 1973, the Review of Progress in Quantitative Nondestructive Evaluation (QNDE) is the premier international NDE meeting designed to provide an interface between research and early engineering through the presentation of current ideas and results focused on facilitating a rapid transfer to engineering development.

This site provides free, public access to papers presented at the annual QNDE conference between 1983 and 1999, and abstracts for papers presented at the conference since 2001.

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Capacitive array sensors are one among many electromagnetic techniques that can be used to detect flaws or other irregularities at or near the surface of materials. Capacitive sensors have an advantage over inductive sensors in that insulating materials may be interrogated as well as conducting materials. These sensors have seen some application in nondestructive evaluation, including flaw detection, the monitoring of porosity and thickness of thermal barrier coatings, dielectric cure monitoring, and robotic proximity sensing [1, 2]. Only surface features can be examined on metallic plates because the accumulation of surface charges blind the capacitive probe to interior features. In dielectric materials, both surface and subsurface features can be examined.

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Sun Jan 01 00:00:00 UTC 1989