Electronic Phase-Stepped Interferometry (EPSI) is a laser-based NDE technique capable of providing out-of-plane displacement and surface topography measurements on the order of a nanometer [1]. The technique has the potential for providing real-time measurement capabilities provided data capture and data reduction rates could be minimized. This in turn could provide an opportunity for studying and characterizing surface defect information in advanced materials such as Ti-6A1-4V and A120204-T3 using time-sequenced studies and methods. The possibility of characterizing defect precursor information may then become possible through time-evolution history studies.