Low noise narrow-band amplification with field effect transistors

Date
1965-02-01
Authors
Mourlan, Louis
Rhinehart, Wayne
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Altmetrics
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Ames Laboratory
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Ames Laboratory
Abstract

Scientists and engineers are often confronted with the problem of detecting the presence of signal levels which approach the noise levels in available amplifying devices. This paper describes the factors which limit amplifier sensitivity and explains what the circuit designer can do to maximize sensitivity.

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