Pulsed eddy current and swept-frequency techniques have both been previously applied to thickness measurement and conductivity profiling of layered metallic samples. Methods of inverting measured signals for thickness measurements and conductivity profiling, in both cases, typically involve iterating with a forward-model until the measured signal value is reached. These inversion methods are extremely time consuming due to the iterative approach. More recently, fast, feature-based methods for conductivity and thickness estimation have been reported. However, these methods involve manually constructing a comprehensive look-up table.