Trends in the Statistical Assessment of Reliability

Date
2009-09-01
Authors
Meeker, William
Journal Title
Journal ISSN
Volume Title
Publisher
Altmetrics
Authors
Research Projects
Organizational Units
Statistics
Organizational Unit
Journal Issue
Series
Abstract

Changes in technology have had and will continue to have a strong effect on changes in the area of statistical assessment of reliability data. These changes include higher levels of integration in electronics, improvements in measurement technology and the deployment of sensors and smart chips into more products, dramatically improved computing power and storage technology, and the development of new, powerful statistical methods for graphics, inference, and experimental design and reliability test planning. This paper traces some of the history of the development of statistical methods for reliability assessment and makes some predictions about the future.

Description

This preprint was published as William Q. Meeker, "Trends in the Statistical Assessment of Reliability", Trends in the Statistical Assessment of Reliability (2010): 3-16, doi: 10.1007/978-0-8176-4924-1_1

Keywords
accelerated testing, Bayesian methods, degradation data, maximum likelihood, multiple failure modes, nonparametric estimation, product design, recurrence data, statistical software, warranty data
Citation
DOI
Source
Collections