Microfocus X-ray and image enhancement techniques were applied to hot-pressed silicon nitride test specimens containing selected subsurface defects. These NDE techniques are being investigated to determine their defect characterization capabilities in various ceramic material systems. Illustrations are presented of defect detection limitations for microfocus X-ray which are primarily associated with low radiographic contrast between defect and parent material. Examples are also shown of defect detectability and geometric sharpness obtained.in ceramic test specimens containing inclusions of high and low density with respect to the parent material.