Accelerated Destructive Degradation Tests Robust to Distribution Misspecification

dc.contributor.author Jeng, Shuen-Lin
dc.contributor.author Huang, Bei-Ying
dc.contributor.author Meeker, William
dc.contributor.author Meeker, William
dc.contributor.department Statistics
dc.date 2018-02-16T21:00:45.000
dc.date.accessioned 2020-07-02T06:56:22Z
dc.date.available 2020-07-02T06:56:22Z
dc.date.issued 2010-12-01
dc.description.abstract <p>Accelerated repeated-measures degradation tests (ARMDTs) take measurements of degradation or performance on a sample of units over time. In certain products, measurements are destructive leading to accelerated destructive degradation test (ADDT) data. For example, the test of a adhesive bond needs to break the test specimen to measure the strength of the bond. Lognormal and Weibull distributions are often used to describe the distribution of product characteristics in life and degradation tests. When the distribution is misspecified, the lifetime quantile, often of interest to the practitioner, may differ significantly between these two distributions. In this study, under a specific ADDT, we investigate the bias and variance due to distribution misspecification. We suggest robust test plans under the criteria of minimizing the approximate mean square error.</p>
dc.description.comments <p>This preprint was published as Shuen-Lin Jeng, Bei-Ying Huang and W.Q. Meeker, " Accelerated Destructive Degradation Tests Robust to Distribution Misspecification", <em>IEEE Transactions on Reliability</em> (2011): 701-711, doi: <a href="http://dx.doi.org/10.1109/TR.2011.2161051" target="_blank">10.1109/TR.2011.2161051</a>.</p>
dc.identifier archive/lib.dr.iastate.edu/stat_las_preprints/74/
dc.identifier.articleid 1074
dc.identifier.contextkey 7418321
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath stat_las_preprints/74
dc.identifier.uri https://dr.lib.iastate.edu/handle/20.500.12876/90370
dc.language.iso en
dc.source.bitstream archive/lib.dr.iastate.edu/stat_las_preprints/74/2011_MeekerWQ_AcceleratedDestructiveDegradation.pdf|||Sat Jan 15 01:47:25 UTC 2022
dc.subject.disciplines Statistics and Probability
dc.subject.keywords distribution misspecification
dc.subject.keywords Weibull
dc.subject.keywords lognormal
dc.subject.keywords mean square error
dc.subject.keywords robust test plan
dc.title Accelerated Destructive Degradation Tests Robust to Distribution Misspecification
dc.type article
dc.type.genre article
dspace.entity.type Publication
relation.isAuthorOfPublication a1ae45d5-fca5-4709-bed9-3dd8efdba54e
relation.isOrgUnitOfPublication 264904d9-9e66-4169-8e11-034e537ddbca
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