Visualization of X-ray scattering process in XRSIM
Date
1998
Authors
Tirukkala, Vamsee Kumar
Major Professor
Advisor
Gray, Joseph N.
Committee Member
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Abstract
One of the important factors that contribute to the long delay in the design and manufacturing cycle is the product inspection. Nondestructive evaluation (NDE) is an increasingly important element in the engineering design process . A major effort is being made in the industry to consider the inspectability of the product as early in the design process as possible and to integrate these considerations into the overall design process. Now days researchers and industries are using computer stimulation techniques for designing and analysis. At the Center for Nondestructive Evaluation(CNDE) a computer model of radiographic inspection known as X-ray Simulation Code (XRSIM) is being developed which can be used for component inspectability and probability of detection. XRSIM has very limited capability to handle x-ray scattering. The work presented here is a part of an effort to develop a tool to calculate and analyze amount of scattering of photons in different directions and also to add the capability to visualize the results and to integrate this model as an extension to XRSIM.
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thesis