Visualization of X-ray scattering process in XRSIM

dc.contributor.advisor Gray, Joseph N.
dc.contributor.author Tirukkala, Vamsee Kumar
dc.date.accessioned 2025-02-06T21:56:30Z
dc.date.available 2025-02-06T21:56:30Z
dc.date.issued 1998
dc.description.abstract One of the important factors that contribute to the long delay in the design and manufacturing cycle is the product inspection. Nondestructive evaluation (NDE) is an increasingly important element in the engineering design process . A major effort is being made in the industry to consider the inspectability of the product as early in the design process as possible and to integrate these considerations into the overall design process. Now days researchers and industries are using computer stimulation techniques for designing and analysis. At the Center for Nondestructive Evaluation(CNDE) a computer model of radiographic inspection known as X-ray Simulation Code (XRSIM) is being developed which can be used for component inspectability and probability of detection. XRSIM has very limited capability to handle x-ray scattering. The work presented here is a part of an effort to develop a tool to calculate and analyze amount of scattering of photons in different directions and also to add the capability to visualize the results and to integrate this model as an extension to XRSIM.
dc.identifier.uri https://dr.lib.iastate.edu/handle/20.500.12876/dvmqloRv
dc.language.iso en
dc.title Visualization of X-ray scattering process in XRSIM
dc.title.alternative Visualization of X ray scattering process in XRSIM
dc.type thesis en_US
dc.type.genre thesis en_US
dspace.entity.type Publication
relation.isDegreeOrgUnitOfPublication 6d38ab0f-8cc2-4ad3-90b1-67a60c5a6f59
thesis.degree.department Mechanical Engineering
thesis.degree.discipline Mechanical Engineering
thesis.degree.level Masters
thesis.degree.name Master of Science
File
Original bundle
Now showing 1 - 1 of 1
No Thumbnail Available
Name:
Tirukkala_ISU-1998-T57.pdf
Size:
1.26 MB
Format:
Adobe Portable Document Format
Description: