Residual Bias Phenomenon in Air‐Coupled Ultrasonic Capacitive Film Transducers

dc.contributor.author Holland, Stephen
dc.contributor.author Song, Junho
dc.contributor.author Chimenti, Dale
dc.contributor.department Department of Aerospace Engineering
dc.date 2018-02-13T03:17:14.000
dc.date.accessioned 2020-06-29T22:44:51Z
dc.date.available 2020-06-29T22:44:51Z
dc.date.copyright Sun Jan 01 00:00:00 UTC 2006
dc.date.embargo 2012-11-20
dc.date.issued 2005-07-01
dc.description.abstract <p>We discuss in this paper the underlying physics of a residual bias phenomenon, whereby the metalized Mylar films of air‐coupled film transducers accept and retain a residual electrostatic charge. Experimental measurements to demonstrate and quantify this effect are reported here, along with a hypothesis of the mechanism of charge transfer and embedding. The measurements show the amplitude performance of the capacitive film transducers as a function of applied bias voltage and frequency. Factors such as humidity and decay time also play roles in the acquisition and holding of charge on a film. We hypothesize that charge transfers from the conductive backplate and collects on the non‐metalized side of the film. The charged films therefore are electrostatically attracted to the transducer backplate even with no applied voltage bias. Typically, an externally applied bias voltage is needed to charge the capacitor. With a persistent residual bias effect, these air‐coupled capacitive film transducers could be used like conventional piezoelectric transducers with no biasing required. This effect has substantial implications for the operation of air‐coupled film transducers.</p>
dc.description.comments <p>Copyright 2006 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.</p> <p>This article appeared in <em>AIP Conference Proceedings</em>, 820 (2006): 916–921 and may be found at <a href="http://link.aip.org/link/doi/10.1063/1.2184623">http://dx.doi.org/10.1063/1.2184623</a>.</p>
dc.identifier archive/lib.dr.iastate.edu/aere_conf/19/
dc.identifier.articleid 1013
dc.identifier.contextkey 3481680
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath aere_conf/19
dc.identifier.uri https://dr.lib.iastate.edu/handle/20.500.12876/1895
dc.language.iso en
dc.source.bitstream archive/lib.dr.iastate.edu/aere_conf/19/Holland_2006_ResidualBiasPhenomenon.pdf|||Fri Jan 14 21:48:33 UTC 2022
dc.subject.disciplines Aerospace Engineering
dc.subject.keywords ultrasonic transducers
dc.subject.keywords capacitive sensors
dc.subject.keywords nondestructive evaluation
dc.subject.keywords nondestructive testing
dc.title Residual Bias Phenomenon in Air‐Coupled Ultrasonic Capacitive Film Transducers
dc.type article
dc.type.genre conference
dspace.entity.type Publication
relation.isAuthorOfPublication dea444ce-079d-483e-8db1-c33100203381
relation.isOrgUnitOfPublication 047b23ca-7bd7-4194-b084-c4181d33d95d
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