Sapphire Fiber Interferometer for Microdisplacement Measurements at High Temperature

dc.contributor.author Murphy, Kent
dc.contributor.author Feth, Shari
dc.contributor.author Vengsarkar, Ashish
dc.contributor.author Claus, Richard
dc.date 2018-02-14T06:55:12.000
dc.date.accessioned 2020-06-30T06:39:11Z
dc.date.available 2020-06-30T06:39:11Z
dc.date.copyright Wed Jan 01 00:00:00 UTC 1992
dc.date.issued 1992
dc.description.abstract <p>Standard silica-based optical fibers are currently being used in a wide variety of sensing applications where the operating temperatures do not exceed 500°C. In a number of applications where higher temperatures are encountered and harsh environments are unavoidable, it is imperative that both optical waveguides and optical waveguide coatings fabricated from materials other than silica be considered. Sapphire is one such candidate material that possesses reasonable optical propagation properties in both fiber and rod form, and can potentially perform without significant degradation under harsh conditions, including temperatures up to 2000°C.</p>
dc.format.mimetype application/pdf
dc.identifier archive/lib.dr.iastate.edu/qnde/1992/allcontent/143/
dc.identifier.articleid 3032
dc.identifier.contextkey 5800962
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath qnde/1992/allcontent/143
dc.identifier.uri https://dr.lib.iastate.edu/handle/20.500.12876/59940
dc.language.iso en
dc.relation.ispartofseries Review of Progress in Quantitative Nondestructive Evaluation
dc.source.bitstream archive/lib.dr.iastate.edu/qnde/1992/allcontent/143/1992_Murphy_SapphireFiber.pdf|||Fri Jan 14 20:17:52 UTC 2022
dc.source.uri 10.1007/978-1-4615-3344-3_143
dc.title Sapphire Fiber Interferometer for Microdisplacement Measurements at High Temperature
dc.type event
dc.type.genre article
dspace.entity.type Publication
relation.isSeriesOfPublication 289a28b5-887e-4ddb-8c51-a88d07ebc3f3
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